Tài liệu IEEE - 2nd (đọc kỹ bài đầu tiên trước khi gửi yêu cầu)

Hi các bạn,Topic để lâu quá mà chưa có ai vào giúp
Nhờ các bạn down dùm mình mấy bài sau mình đang cần:
1- A novel algorithm for space vector modulated two-stage matrix converter
Gang Li; Kai Sun; Lipei Huang;
Electrical Machines and Systems, 2008. ICEMS 2008. International Conference on
17-20 Oct. 2008 Page(s):1316 - 1320
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4770926&isnumber=4770630
2- A Novel Over Modulation Strategy for Two-Stage Matrix Converter
Zhiyong Li; Xiangdong Kong; Xiaoying Li;
Measuring Technology and Mechatronics Automation, 2009. ICMTMA ''09. International Conference on
Volume 2, 11-12 April 2009 Page(s):617 - 620
Digital Object Identifier 10.1109/ICMTMA.2009.573
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5203509&isnumber=5203355
3- Two New Modulation Strategies for Two-Stage Matrix Converter under Nonsinusoidal Input Voltages
Xin-dong Xu; Mei Su; Yao Sun; Wei-hua Gui;
Industrial Electronics and Applications, 2007. ICIEA 2007. 2nd IEEE Conference on
23-25 May 2007 Page(s):1917 - 1921
Digital Object Identifier 10.1109/ICIEA.2007.4318744
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4318744&isnumber=4318335
4- A New Three-Level Indirect Matrix Converter with Reduced Number of Switches
Klumpner, C.; Meng Lee; Pitic, C.; Wheeler, P.; Zanchetta, P.;
Industry Applications Conference, 2007. 42nd IAS Annual Meeting. Conference Record of the 2007 IEEE
23-27 Sept. 2007 Page(s):186 - 193
Digital Object Identifier 10.1109/07IAS.2007.28
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=4347785&isnumber=4347749
5- Two-stage matrix converter used in wind power generation system appilcation research
Zhang, R.H.; Liu, X.Y.; Wu, H.T.; Wang, Z.C.;
Industrial Electronics and Applications, 2009. ICIEA 2009. 4th IEEE Conference on
25-27 May 2009 Page(s):3560 - 3564
Digital Object Identifier 10.1109/ICIEA.2009.5138869
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5138869&isnumber=5138149
6- Modulation Strategy Research for Dual Bridge Matrix Converter on DSP
Zhiyong Li; Hao Cai; Xiaoying Li; Xiangdong Kong;
Measuring Technology and Mechatronics Automation, 2009. ICMTMA ''09. International Conference on
Volume 3, 11-12 April 2009 Page(s):396 - 399
Digital Object Identifier 10.1109/ICMTMA.2009.572
http://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=5203228&isnumber=5203125
Thanks trước

Anh nghichngam download ho em bai bao nay nhe
1-GMPLS and IP+MPLS interworking technologies - routing and signaling
Shimazaki, D. Oki, E. Shiomoto, K. Yamanaka, N.
NTT Network Innovation Labs., NTT Corp., Tokyo, Japan;
This paper appears in: High Performance Switching and Routing, 2004. HPSR. 2004 Workshop on
Publication Date: 2004
On page(s): 27- 31
ISSN:
ISBN: 0-7803-8375-3
INSPEC Accession Number: 7963504
Digital Object Identifier: 10.1109/HPSR.2004.1303419
Current Version Published: 2004-08-24
http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1303419
2-QoS in GMPLS based IP/DWDM Metro Networks
Colitti, W. Steenhaut, K. Nowe, A.
Vrije Univ. Brussel, Brussels
This paper appears in: Local & Metropolitan Area Networks, 2007. LANMAN 2007. 15th IEEE Workshop on
Publication Date: 10-13 June 2007
On page(s): 84 - 89
Location: Princeton, NJ
ISBN: 1-4244-1100-9
Digital Object Identifier: 10.1109/LANMAN.2007.4295980
Current Version Published: 2007-08 -27
http://ieeexplore.ieee.org/servlet/opa c?punumber=4295958
3-Generalized multiprotocol label switching: an overview of signaling enhancements and recovery techniques
Banerjee, A. Drake, L. Lang, L. Turner, B. Awduche, D. Berger, L. Kompella, K. Rekhter, Y.
This paper appears in: Communications Magazine, IEEE
Publication Date: July 2001
Volume: 39 , Issue: 7
On page(s): 144 - 151
ISSN: 0163-6804
Digital Object Identifier: 10.1109/35.933450
Current Version Published: 2002-08-07
Frequency: 12
ISSN: 0163-6804
http://ieeexplore.ieee.org/servlet/opac?punumber=35
4-Multi-layer network management system with dynamic control of MPLS/GMPLS LSPs based on IP flows
Miyazawa, M. Ogaki, K. Otani, T.
KDDI R&D Labs. Inc., Fujimino
This paper appears in: Network Operations and Management Symposium, 2008. NOMS 2008. IEEE
Publication Date: 7-11 April 2008
On page(s): 263 - 270
Location: Salvador, Bahia
ISSN: 1542-1201
ISBN: 978-1-4244-2065-0
Digital Object Identifier: 10.1109/NOMS.2008.4575143
Current Version Published: 2008-08-26
http://ieeexplore.ieee.org/servlet/opac?punumber=4567164
5-Analysis of GMPLS architectures, topologies and algorithms
Jong-Moon Chung Khan, H.K. Hooi Miin Soo Reyes, J.S. Cho, G.Y.
Sch. of Electr. & Comput. Eng., Oklahoma State Univ., Stillwater, OK, USA
This paper appears in: Circuits and Systems, 2002. MWSCAS-2002. The 2002 45th Midwest Symposium on
Publication Date: 4-7 Aug. 2002
Volume: 3
On page(s): III-284 - III-287 vol.3
ISSN:
ISBN: 0-7803-7523-8
Current Version Published: 2003-03-20
http://ieeexplore.ieee.org/servlet/opac?punumber=8452
6-Enhancing GMPLS Signaling Protocol for Encompassing Quality of Transmission (QoT) in All-Optical Networks
Cugini, F. Sambo, N. Andriolli, N. Giorgetti, A. Valcarenghi, L. Castoldi, P. Le Rouzic, E. Poirrier, J.
Consorzio Naz. Interuniversitario per le Telecomun. (CNIT), Pisa
This paper appears in: Lightwave Technology, Journal of
Publication Date: Oct.1, 2008
Volume: 26 , Issue: 19
On page(s): 3318 - 3328
Location: Houston, TX, USA
ISSN: 0733-8724
Digital Object Identifier: 10.1109/JLT.2008.925674
Current Version Published: 2009-01-06
Được romeomotminh sửa chữa / chuyển vào 10:37 ngày 11/01/2010

Trưừng bác có tiền mua IEEE thì chắc cũng mua caái ày, nếu có bác down dùm em nhé
Dalton Trans., 2008, 5501 - 5506, DOI: 10.1039/b805658g
Nanostructured thin solid oxide fuel cells with high power density
Alex Ignatiev, Xin Chen, Naijuan Wu, Zigui Lu and Laverne Smith
http://www.rsc.org/publishing/journals/DT/article.asp?doi=b805658g
Cám ơn bác

Chào các anh, các anh down giúp em các tài liệu này với. Thánks
Sources of real exchange-rate fluctuations: How important are nominal shocks?
http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6V8D-45D17CF-1&_user=8888412&_rdoc=1&_fmt=&_orig=search&_sort=d&_docanchor=&view=c&_acct=C000050221&_version=1&_urlVersion=0&_userid=8888412&md5=f3406ec32b2dd254b1af2f7b61832148
Fixing exchange rates A virtual quest for fundamentals*1
http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6VBW-3YN9DS5-P&_user=8888412&_rdoc=1&_fmt=&_orig=search&_sort=d&_docanchor=&view=c&_acct=C000050221&_version=1&_urlVersion=0&_userid=8888412&md5=b74caf0ab6677e2a22dd776a7d8ac035
Chapter 33 Empirical research on nominal exchange rates
http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B7P5T-4FKY233-F&_user=8888412&_rdoc=1&_fmt=&_orig=search&_sort=d&_docanchor=&view=c&_acct=C000050221&_version=1&_urlVersion=0&_userid=8888412&md5=0972451aa5eaa105c98f9e851b163e1d
A panel project on purchasing power parity: Mean reversion within and between countries
http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6V6D-3VVVRBH-C&_user=8888412&_rdoc=1&_fmt=&_orig=search&_sort=d&_docanchor=&view=c&_acct=C000050221&_version=1&_urlVersion=0&_userid=8888412&md5=637f61f0289faa222879588dba46750b
The collapse of purchasing power parities during the 1970''s
http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6V64-45F63R6-H1&_user=8888412&_rdoc=1&_fmt=&_orig=search&_sort=d&_docanchor=&view=c&_acct=C000050221&_version=1&_urlVersion=0&_userid=8888412&md5=a6507c32af4cf4b98b242ec320725eec#m4.1
Chapter 32 Perspectives on PPP and long-run real exchange rates
http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B7P5T-4FKY233-D&_user=8888412&_rdoc=1&_fmt=&_orig=search&_sort=d&_docanchor=&view=c&_acct=C000050221&_version=1&_urlVersion=0&_userid=8888412&md5=f6a623ba223c21199b5f1deab24ac408
Real exchange rates in the short, medium, and long run
http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6V6D-45N4M59-9&_user=8888412&_rdoc=1&_fmt=&_orig=search&_sort=d&_docanchor=&view=c&_acct=C000050221&_version=1&_urlVersion=0&_userid=8888412&md5=a6c9e5400ba9299266dc4a12b9899b8b
The determination of the real exchange rate : The productivity approach
http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6V6D-45GNJ6H-17&_user=8888412&_rdoc=1&_fmt=&_orig=search&_sort=d&_docanchor=&view=c&_acct=C000050221&_version=1&_urlVersion=0&_userid=8888412&md5=08f21507ce5616031530885a52d8afd2
An empirical investigation of the long-run behavior of real exchange rates*1
http://www.sciencedirect.com/science?_ob=ArticleURL&_udi=B6V8D-4C3TKWC-7&_user=8888412&_rdoc=1&_fmt=&_orig=search&_sort=d&_docanchor=&view=c&_acct=C000050221&_version=1&_urlVersion=0&_userid=8888412&md5=0360fffbcb59cdf268f259931bf86632

chao cac anh.
Nho cac anh tim giup 2 bai bao nay duoc khong a.
1.Overvoltages provoked by faults in the distribution electrical network
Uglesic, I. Delbianco, L. Babic, S.
Fac. of Electr. Eng., Zagreb Univ., Croatia;
This paper appears in: Electrotechnical Conference, 2000. MELECON 2000. 10th Me***erranean
Journal: IEEE
Publication Date: 29-31 May 2000
Volume: 3, On page(s): 895- 898 vol.3
ISSN:
ISBN: 0-7803-6290-X
INSPEC Accession Number: 7042201
Current Version Published: 2002-08-06
http://ieeexplore.ieee.org/Xplore/login.jsp?url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel5%2F7056%2F19030%2F00879676.pdf%3Farnumber%3D879676&authDecision=-203
2. Characteristics of earth faults in power systems with a compensated or an unearthed neutral
Hanninen, S. Lehtonen, M. Hakola, T. Antila, E. Strom, J. Ingman, S.
VTT Energy, Finland;
This paper appears in: Electricity Distribution. Part 1: Contributions. CIRED. 14th International Conference and Exhibition on (IEE Conf. Publ. No. 438)
Journal: IEEE
Publication Date: 2-5 June 1997
Volume: 1, On page(s): 16/1- 16/5 vol.2
ISSN: 0537-9989
ISBN: 0-85296-674-1
INSPEC Accession Number: 5665645
Current Version Published: 2002-08-06
http://ieeexplore.ieee.org/Xplore/login.jsp?url=http%3A%2F%2Fieeexplore.ieee.org%2Fiel4%2F5433%2F14679%2F00667245.pdf%3Farnumber%3D667245&authDecision=-203
Cam on anh nhieu!

Kính gửi bác nghichnham!
Em đang nghiên cứu về redundant systems sử dụng thiết kế diversity metric, em đang cần tài liệu trên IEEE quá. Mong bác hết sức giúp đỡ em được không? Ngoài ra trên topic có bác nào down được thì cũng giúp em nhé. Rất cảm ơn mọi người. Dưới đây là tài liệu em cần:
1- A Theoretical Basis for the Analysis of Multiversion Software Subject to Coincident Errors
Eckhardt, D.E., Jr. Lee, L.D.
This paper appears in: Software Engineering, IEEE Transactions on
Publication Date: Dec. 1985
Volume: SE-11, Issue: 12
On page(s): 1511- 1517
ISSN: 0098-5589
Current Version Published: 2006-09-18
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1701974
2- Evaluation and comparison of fault-tolerant software techniques
Hudak, J.J. Suh, B.-H. Siewiorek, D.P. Segall, Z.
Carnegie Mellon Univ., Pittsburgh, PA;
This paper appears in: Reliability, IEEE Transactions on
Publication Date: Jun 1993
Volume: 42, Issue: 2
On page(s): 190-204
ISSN: 0018-9529
References Cited: 21
CODEN: IERQAD
INSPEC Accession Number: 4505228
Digital Object Identifier: 10.1109/24.229487
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=229487
3- Architectural principles for safety-critical real-time applications
Lala, J.H. Harper, R.E.
Charles Stark Draper Lab. Inc., Cambridge, MA;
This paper appears in: Proceedings of the IEEE
Publication Date: Jan 1994
Volume: 82, Issue: 1
On page(s): 25-40
ISSN: 0018-9219
References Cited: 32
CODEN: IEEPAD
INSPEC Accession Number: 4646680
Digital Object Identifier: 10.1109/5.259424
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=259424
4- Fault Equivalence in Combinational Logic Networks
McCluskey, E.J. Clegg, F.W.
This paper appears in: Computers, IEEE Transactions on
Publication Date: Nov. 1971
Volume: C-20, Issue: 11
On page(s): 1286- 1293
ISSN: 0018-9340
Current Version Published: 2006-08-14
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1671722
5- Probability models for pseudorandom test sequences
McCluskey, E.J. Makar, S. Mourad, S. Wagner, K.D.
Center for Reliable Comput., Stanford Univ., CA ;
This paper appears in: Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publication Date: Jan 1988
Volume: 7, Issue: 1
On page(s): 68-74
ISSN: 0278-0070
References Cited: 26
CODEN: ITCSDI
INSPEC Accession Number: 3130638
Digital Object Identifier: 10.1109/43.3131
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=3131
6- Common-mode failures in redundant VLSI systems: a survey
Mitra, S. Saxena, N.R. McCluskey, E.J.
Center for Reliable Comput., Stanford Univ., CA ;
This paper appears in: Reliability, IEEE Transactions on
Publication Date: Sep 2000
Volume: 49, Issue: 3
On page(s): 285-295
ISSN: 0018-9529
References Cited: 57
CODEN: IERQAD
INSPEC Accession Number: 6896665
Digital Object Identifier: 10.1109/24.914545
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=914545
7- Fault escapes in duplex systems
Mitra, S. Saxena, N.R. McCluskey, E.J.
Dept. of Electr. Eng., Stanford Univ., CA;
This paper appears in: VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Publication Date: 2000
On page(s): 453-458
Meeting Date: 04/30/2000 - 05/04/2000
Location: Montreal, Que., Canada
ISBN: 0-7695-0613-5
References Cited: 18
INSPEC Accession Number: 6656774
Digital Object Identifier: 10.1109/VTEST.2000.843878
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=843878
8- Design diversity for concurrent error detection in sequential logiccircuits
Mitra, S. McCluskey, E.J.
Center for Reliable Comput., Stanford Univ., CA ;
This paper appears in: VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Publication Date: 2001
On page(s): 178-183
Meeting Date: 04/29/2001 - 05/03/2001
Location: Marina Del Rey, CA, USA
ISBN: 0-7695-1122-8
References Cited: 19
INSPEC Accession Number: 7023719
Digital Object Identifier: 10.1109/VTS.2001.923436
Current Version Published: 2002-08-07
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=923436
9- Design of redundant systems protected against common-mode failures
Mitra, S. McCluskey, E.J.
Center for Reliable Comput., Stanford Univ., CA ;
This paper appears in: VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Publication Date: 2001
On page(s): 190-195
Meeting Date: 04/29/2001 - 05/03/2001
Location: Marina Del Rey, CA, USA
ISBN: 0-7695-1122-8
References Cited: 14
INSPEC Accession Number: 7023721
Digital Object Identifier: 10.1109/VTS.2001.923438
Current Version Published: 2002-08-07
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=923438
10- Heavy ion and proton-induced single event multiple upset
Reed, R.A. Carts, M.A. Marshall, P.W. Marshall, C.J. Musseau, O. McNulty, P.J. Roth, D.R. Buchner, S. Melinger, J. Corbiere, T.
Naval Res. Lab., Washington, DC;
This paper appears in: Nuclear Science, IEEE Transactions on
Publication Date: Dec 1997
Volume: 44, Issue: 6, Part 1
On page(s): 2224-2229
Meeting Date: 07/21/1997 - 07/25/1997
Location: Snowmass Village, CO, USA
ISSN: 0018-9499
References Cited: 28
CODEN: IETNAE
INSPEC Accession Number: 5804603
Digital Object Identifier: 10.1109/23.659039
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=659039
11- Dependable adaptive computing systems-the ROAR project
Saxena, N.R. McCluskey, E.J.
Center for Reliable Comput., Stanford Univ., CA ;
This paper appears in: Systems, Man, and Cybernetics, 1998. 1998 IEEE International Conference on
Publication Date: 11-14 Oct 1998
Volume: 3, On page(s): 2172-2177 vol.3
Meeting Date: 10/11/1998 - 10/14/1998
Location: San Diego, CA, USA
ISBN: 0-7803-4778-1
References Cited: 12
INSPEC Accession Number: 6189461
Digital Object Identifier: 10.1109/ICSMC.1998.724977
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=724977
12- Reliability Modeling of Compensating Module Failures in Majority Voted Redundancy
Siewiorek, D.P.
This paper appears in: Computers, IEEE Transactions on
Publication Date: May 1975
Volume: C-24, Issue: 5
On page(s): 525- 533
ISSN: 0018-9340
Current Version Published: 2006-08-14
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1672849
13- Reliability of majority voting based VLSI fault-tolerant circuits
Stroud, C.E.
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY;
This paper appears in: Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publication Date: Dec 1994
Volume: 2, Issue: 4
On page(s): 516-521
ISSN: 1063-8210
References Cited: 13
CODEN: IEVSE9
INSPEC Accession Number: 4839257
Digital Object Identifier: 10.1109/92.335020
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=335020
14- Fault Folding for Irredundant and Redundant Combinational Circuits
Kilin To
This paper appears in: Computers, IEEE Transactions on
Publication Date: Nov. 1973
Volume: C-22, Issue: 11
On page(s): 1008- 1015
ISSN: 0018-9340
Current Version Published: 2006-08-14
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1672230
15- Failure-Tolerant Sequential Machines with Past Information
Tohma, Y. Aoyagi, S.
This paper appears in: Computers, IEEE Transactions on
Publication Date: April 1971
Volume: C-20, Issue: 4
On page(s): 392- 396
ISSN: 0018-9340
Current Version Published: 2006-08-14
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1671847
16- Modeling correlation in software recovery blocks
Tomek, L.A. Muppala, J.K. Trivedi, K.S.
Dept. of Comput. Sci., Duke Univ., Durham, NC;
This paper appears in: Software Engineering, IEEE Transactions on
Publication Date: Nov 1993
Volume: 19, Issue: 11
On page(s): 1071-1086
ISSN: 0098-5589
References Cited: 27
CODEN: IESEDJ
INSPEC Accession Number: 4609806
Digital Object Identifier: 10.1109/32.256854
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=256854

Nghichngam dau ? Online di

Mình đang làm đề tài về mạng nơ ron ứng dụng bù công suất phản kháng trong lưới phân phối. Mình rất cần 1 số tài liệu này mong bạn tìm giúp. Thanks so much..

1. Neural Network-Based Selective Compensation of Current Quality Problems in Distribution System
Zhu, J.Z. Chang, C.S. Yan, W. Xu, G.Y.
Dept. of Electr. Eng., Nat. Univ. of Singapore
This paper appears in: Industrial Electronics, IEEE Transactions on
Issue Date: Feb. 2007
Volume: 54 Issue:1
On page(s): 53 - 60
ISSN: 0278-0046
INSPEC Accession Number: 9299031
Digital Object Identifier: 10.1109/TIE.2006.888754
Date of Current Version: 05 February 2007
Sponsored by: IEEE Industrial Electronics Society
link: http://ieeexplore.ieee.org/xpl/freea...number=4084701
2. Reactive power optimisation using an analytic hierarchical process and a nonlinear optimisation neural network approach
Zhu, J.Z. Chang, C.S. Yan, W. Xu, G.Y.
Dept. of Electr. Eng., Nat. Univ. of Singapore
This paper appears in: Generation, Transmission and Distribution, IEE Proceedings-
Issue Date : Jan 1998
Volume : 145 , Issue:1
On page(s): 89 - 97
ISSN : 1350-2360
References Cited: 14
INSPEC Accession Number: 5830583
Date of Current Version : 06 August 2002
Sponsored by : IET
link: http://ieeexplore.ieee.org/search/fr...d%3DSearch+All
3. An artificial neural network based application to reactive power dispatch problem
This paper appears in: Electrotechnical Conference, 1998. MELECON 98., 9th Me***erranean
Issue Date : 18-20 May 1998
Volume : 2
On page(s): 1080 - 1083 vol.2
Location: Tel-Aviv
Meeting Date : 18 May 1998-20 May 1998
Print ISBN: 0-7803-3879-0
References Cited: 7
INSPEC Accession Number: 6128103
Digital Object Identifier : 10.1109/MELCON.1998.699398
Date of Current Version : 06 August 2002
link: http://ieeexplore.ieee.org/search/fr...d%3DSearch+All
4. Fast power flow with capability of corrective control using a neural network
This paper appears in: Circuits and Systems, 1992., Proceedings of the 35th Midwest Symposium on
Issue Date : 9-12 Aug 1992
On page(s): 1057 - 1060 vol.2
Location: Washington, DC
Meeting Date : 09 Aug 1992-12 Aug 1992
Print ISBN: 0-7803-0510-8
References Cited: 4
INSPEC Accession Number: 4584396
Digital Object Identifier : 10.1109/MWSCAS.1992.271112
Date of Current Version : 06 August 2002
link: http://ieeexplore.ieee.org/search/fr...d%3DSearch+All
5. Modern power system
This paper appears in: Information and Communication Technology in Electrical Sciences (ICTES 2007), 2007. ICTES. IET-UK International Conference on
Issue Date : 20-22 Dec. 2007
On page(s): I-6 - I-6
Location: Chennai, Tamilnadu, India
ISSN : 0537-9989
Date of Current Version : 30 December 2008
link: http://ieeexplore.ieee.org/search/fr...d%3DSearch+All

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1. High Performance 45-nm SOI Technology with Enhanced Strain, Porous Low-k BEOL, and Immersion Lithography
Narasimha, S.; Onishi, K.; Nayfeh, H.M.; Waite, A.; Weybright, M.; Johnson, J.; Fonseca, C.; Corliss, D.; Robinson, C.; Crouse, M.; Yang, D.; Wu, C.-H.J.; Gabor, A.; Adam, T.; Ahsan, I.; Belyansky, M.; Black, L.; Butt, S.; Cheng, J.; Chou, A.; Costrini, G.; Dimitrakopoulos, C.; Domenicucci, A.; Fisher, P.; Frye, A.; Gates, S.; Greco, S.; Grunow, S.; Hargrove, M.; Holt, J.; Jeng, S.-J.; Kelling, M.; Kim, B.; Landers, W.; Larosa, G.; Lea, D.; Lee, M.H.; Liu, X.; Lustig, N.; McKnight, A.; Nicholson, L.; Nielsen, D.; Nummy, K.; Ontalus, V.; Ouyang, C.; Ouyang, X.; Prindle, C.; Pal, R.; Rausch, W.; Restaino, D.; Sheraw, C.; Sim, J.; Simon, A.; Standaert, T.; Sung, C.Y.; Tabakman, K.; Tian, C.; Van Den Nieuwenhuizen, R.; Van Meer, H.; Vayshenker, A.; Wehella-Gamage, D.; Werking, J.; Wong, R.C.; Yu, J.; Wu, S.; Augur, R.; Brown, D.; Chen, X.; Edelstein, D.; Grill, A.; Khare, M.; Li, Y.; Luning, S.; Norum, J.; Sankaran, S.; Schepis, D.; Wachnik, R.; Wise, R.; Warm, C.; Ivers, T.; Agnello, P.;
IBM Syst. & Technol. Group, IBM Semicond. Res. & Dev. Center, Hopewell Junction, NY
This paper appears in: Electron Devices Meeting, 2006. IEDM '06. International
Issue Date: 11-13 Dec. 2006
On page(s): 1 - 4
Location: San Francisco, CA
Print ISBN: 1-4244-043
INSPEC Accession Number: 9485665
Digital Object Identifier: 10.1109/IEDM.2006.346879
Date of Current Version: 16 April 2007
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=4154298


2. High performance CMOSFET technology for 45nm generation
Oishi, A. Komoda, T. Morimasa, Y. Sanuki, T. Yamasaki, H. Hamaguchi, M. Oouchi, K. Matsuo, K. Iinuma, T. Itoh, T. Takegawa, Y. Iwai, M. Sunouchi, K. Noguchi, T.
Syst. LSI Div., Toshiba Corp., Yokohama, Japan

This paper appears in: VLSI Technology, 2004. Digest of Technical Papers. 2004 Symposium on
Issue Date : 15-17 June 2004
On page(s): 166 - 167
Print ISBN: 0-7803-8289-7
INSPEC Accession Number: 8058244
Digital Object Identifier : 10.1109/VLSIT.2004.1345458
Date of Current Version : 25 October 2004
Link: http://ieeexplore.ieee.org/search/f...nm&openedRefinements=*&searchField=Search All


3. 45nm CMOS platform technology (CMOS6) with high density embedded memories

Iwai, M. Oishi, A. Sanuki, T. Takegawa, Y. Komoda, T. Morimasa, Y. Ishimaru, K. Takayanagi, M. Eguchi, K. Matsu****a, D. Muraoka, K. Sunouchi, K. Noguchi, T.
Syst. LSI division, Toshiba Corp., Yokohama, Japan

This paper appears in: VLSI Technology, 2004. Digest of Technical Papers. 2004 Symposium on
Issue Date : 15-17 June 2004
On page(s): 12 - 13
Print ISBN: 0-7803-8289-7
INSPEC Accession Number: 8048231
Digital Object Identifier : 10.1109/VLSIT.2004.1345364
Date of Current Version : 25 October 2004
Link: http://ieeexplore.ieee.org/search/f...nm&openedRefinements=*&searchField=Search All


4. Challenges in implementing high-k dielectrics in the 45nm technology node
Lee, B.H. Song, S.C. Choi, R. Wen, H.C. Majhi, P. Kirsch, P. Young, C. Bersuker, G.
SEMATECH, Austin, TX, USA

This paper appears in: Integrated Circuit Design and Technology, 2005. ICICDT 2005. 2005 International Conference on
Issue Date : 9-11 May 2005
On page(s): 73 - 76
Print ISBN: 0-7803-9081-4
INSPEC Accession Number: 8531354
Digital Object Identifier : 10.1109/ICICDT.2005.1502595
Date of Current Version : 06 September 2005
Link: http://ieeexplore.ieee.org/search/f...nm&openedRefinements=*&searchField=Search All


5. Challenges at 45nm and beyond
Bailey, Dan Soenen, Eric Gupta, Puneet Villarrubia, Paul Sang Dhong,
Advanced Micro Devices, Inc., Austin, TX, USA

This paper appears in: Computer-Aided Design, 2008. ICCAD 2008. IEEE/ACM International Conference on
Issue Date : 10-13 Nov. 2008
On page(s): xiii - xiii
Location: San Jose, CA, USA
ISSN : 1092-3152
Print ISBN: 978-1-4244-2819-9
Digital Object Identifier : 10.1109/ICCAD.2008.4681538
Date of Current Version : 18 November 2008
Link: http://ieeexplore.ieee.org/search/f...nm&openedRefinements=*&searchField=Search All


6. Reliability for manufacturing on 45nm logic technology with high-k + metal gate transistors and Pb-free packaging
Kasim, R. Connor, C. Hicks, J. Jopling, J. Litteken, C.
Logic Technol. Dev. Quality & Reliability, Intel Corp., Hillsboro, OR, USA

This paper appears in: Reliability Physics Symposium, 2009 IEEE International
Issue Date : 26-30 April 2009
On page(s): 350 - 354
Location: Montreal, QC
ISSN : 1541-7026
Print ISBN: 978-1-4244-2888-5
INSPEC Accession Number: 10800133
Digital Object Identifier : 10.1109/IRPS.2009.5173277
Date of Current Version : 24 July 2009
Link: http://ieeexplore.ieee.org/search/f...nm&openedRefinements=*&searchField=Search All


7. Design and CAD Challenges in 45nm CMOS and beyond
Frank, D.J. Puri, R. Toma, D.
IBM TJ Watson Res. Center, Yorktown Heights, NY

This paper appears in: Computer-Aided Design, 2006. ICCAD '06. IEEE/ACM International Conference on
Issue Date : 5-9 Nov. 2006
On page(s): 329 - 333
Location: San Jose, CA
ISSN : 1092-3152
Print ISBN: 1-59593-389-1
INSPEC Accession Number: 9442238
Digital Object Identifier : 10.1109/ICCAD.2006.320054
Date of Current Version : 26 February 2007
Link: http://ieeexplore.ieee.org/search/f...nm&openedRefinements=*&searchField=Search All


8. Challenges for process and product integration at 45nm
Stork, H.
Texas Instruments Inc., Dallas, TX

This paper appears in: VLSI Technology, Systems, and Applications, 2006 International Symposium on
Issue Date : 24-26 April 2006
On page(s): 1 - 1
Location: Hsinchu
ISSN : 1930-885X
Print ISBN: 1-4244-0181-4
INSPEC Accession Number: 9122709
Digital Object Identifier : 10.1109/VTSA.2006.251112
Date of Current Version : 30 November 2006
Link: http://ieeexplore.ieee.org/search/f...nements=*&pageNumber=2&searchField=Search All


9. A conventional 45nm CMOS node low-cost platform for general purpose and low power applications
Boeuf, F. Arnaud, F. Basso, M.T. Sotta, D. Wacquant, F. Rosa, J. Bicais-Lepinay, N. Bernard, H. Bustos, J. Manakli, S. Gaillardin, M. Grant, J. Skotnicki, T. Tavel, B. Duriez, B. Bidaud, M. Gouraud, P. Chaton, C. Morin, P. Todeschini, J. Jur***, M. Pain, L. De-Jonghe, V. El-Farhane, R. Jullian, S.
STMicroelectronics, Crolles, France

This paper appears in: Electron Devices Meeting, 2004. IEDM Technical Digest. IEEE International
Issue Date : 13-15 Dec. 2004
On page(s): 425 - 428
Print ISBN: 0-7803-8684-1
INSPEC Accession Number: 8394438
Digital Object Identifier : 10.1109/IEDM.2004.1419177
Date of Current Version : 25 April 2005
Link: http://ieeexplore.ieee.org/search/f...nements=*&pageNumber=2&searchField=Search All


10. High-Performance Low Operation Power Transistor for 45nm Node Universal Applications
Shima, M. Okabe, K. Yamaguchi, A. Sakoda, T. Kawamura, K. Pidin, S. Okuno, M. Owada, T. Sugimoto, K. Ogura, J. Kokura, H. Morioka, H. Watanabe, T. Isome, T. Okoshi, K. Mori, T. Hayami, Y. Minakata, H. Hatada, A. Shimamune, Y. Katakami, A. Ota, H. Sakuma, T. Miya****a, T. Hosaka, K. Fukutome, H. Tamura, N. Aoyama, T. Sukegawa, K. Nakaishi, M. Fukuyama, S. Nakai, S. Kojima, M. Sato, S. Miyajima, M. Hashimoto, K. Sugii, T.
Fujitsu Labs. Ltd., Tokyo

This paper appears in: VLSI Technology, 2006. Digest of Technical Papers. 2006 Symposium on
Issue Date : 0-0 0
On page(s): 156 - 157
Location: Honolulu, HI
Print ISBN: 1-4244-0005-8
INSPEC Accession Number: 9177111
Digital Object Identifier : 10.1109/VLSIT.2006.1705264
Date of Current Version : 02 October 2006
Link: http://ieeexplore.ieee.org/search/f...nements=*&pageNumber=2&searchField=Search All


11. The effect of gate oxide thickness and drain bias on NBTI degradation in 45nm PMOS
Hatta, S.F.W.M. Soin, N. Zhang, J.F.
Dept. of Electr. Eng., Univ. Malaya(UM), Kuala Lumpur, Malaysia

This paper appears in: Semiconductor Electronics (ICSE), 2010 IEEE International Conference on
Issue Date : 28-30 June 2010
On page(s): 210 - 213
Location: Melaka
Print ISBN: 978-1-4244-6608-5
INSPEC Accession Number: 11476273
Digital Object Identifier : 10.1109/SMELEC.2010.5549558
Date of Current Version : 16 August 2010
Link: http://ieeexplore.ieee.org/search/f...nements=*&pageNumber=2&searchField=Search All


12. Development of New TiN/ZrO2/Al2O3/ZrO2/TiN Capacitors Extendable to 45nm Generation DRAMs Replacing HfO2 Based Dielectrics
Deok-Sin Kil Han-Sang Song Kee-Jeung Lee Kwon Hong Jin-Hyock Kim Ki-Seon Park Seung-Jin Yeom Jae-Sung Roh Noh-Jung Kwak Hyun-Chul Sohn Jin-Woong Kim Sung-Wook Park
R&D Div., Hynix Semicond. Inc., Kyoungki

This paper appears in: VLSI Technology, 2006. Digest of Technical Papers. 2006 Symposium on
Issue Date : 0-0 0
On page(s): 38 - 39
Location: Honolulu, HI
Print ISBN: 1-4244-0005-8
INSPEC Accession Number: 9177076
Digital Object Identifier : 10.1109/VLSIT.2006.1705205
Date of Current Version : 02 October 2006
Link: http://ieeexplore.ieee.org/search/f...nements=*&pageNumber=2&searchField=Search All


13. Characterization and optimizations of silicide thickness in 45nm pMOS device
Salehuddin, F. Ahmad, I. Hamid, F.A. Zaharim, A.
Coll. of Eng., Univ. Tenaga Nasional (UNITEN), Kajang, Malaysia

This paper appears in: Electronic Devices, Systems and Applications (ICEDSA), 2010 Intl Conf on
Issue Date : 11-14 April 2010
On page(s): 300 - 304
Location: Kuala Lumpur
Print ISBN: 978-1-4244-6629-0
INSPEC Accession Number: 11412778
Digital Object Identifier : 10.1109/ICEDSA.2010.5503054
Date of Current Version : 01 July 2010
Link: http://ieeexplore.ieee.org/search/f...nements=*&pageNumber=2&searchField=Search All


14. Highly Manufacturable 45nm LSTP CMOSFETs Using Novel Dual High-k and Dual Metal Gate CMOS Integration
Song, S.C. Zhang, Z.B. Hussain, M.M. Huffman, C. Barnett, J. Bae, S.H. Li, H.J. Majhi, P. Park, C.S. Ju, B.S. Park, H.K. Kang, C.Y. Choi, R. Zeitzoff, P. Tseng, H.H. Lee, B.H. Jammy, R.
Sematech, Austin, TX

This paper appears in: VLSI Technology, 2006. Digest of Technical Papers. 2006 Symposium on
Issue Date : 0-0 0
On page(s): 13 - 14
Location: Honolulu, HI
Print ISBN: 1-4244-0005-8
INSPEC Accession Number: 9177068
Digital Object Identifier : 10.1109/VLSIT.2006.1705193
Date of Current Version : 02 October 2006
Link: http://ieeexplore.ieee.org/search/f...nements=*&pageNumber=2&searchField=Search All

15. Advanced Ni-based FUlly SIlicidation (FUSI) technology for sub-45nm CMOS devices
H.Y. Yu M.F. Li A. Lauwers J. A. Kittl R. Singanamalla A. Veloso T. Hoffmann K. De Meyer M. Jurczak P. Absil S. Biesemans
IMEC, Leuven

This paper appears in: Solid-State and Integrated Circuit Technology, 2006. ICSICT '06. 8th International Conference on
Issue Date : Oct. 2006
On page(s): 404 - 407
Location: Shanghai
Print ISBN: 1-4244-0160-7
INSPEC Accession Number: 9398399
Digital Object Identifier : 10.1109/ICSICT.2006.306263
Date of Current Version : 02 April 2007
Link: http://ieeexplore.ieee.org/search/f...nements=*&pageNumber=3&searchField=Search All


16. High-performance and low-voltage challenges for sub-45nm microprocessor circuits
Krishnamurthy, R.K. Mathew, S.K. Anders, M.A. Hsu, S.K. Kaul, H. Borkar, S.
Microprocessor Technol. Labs, Intel Corp., Hillsboro, OR, USA

This paper appears in: ASIC, 2005. ASICON 2005. 6th International Conference On
Issue Date : 24-27 Oct. 2005
Volume : 1
On page(s): 283 - 286
Print ISBN: 0-7803-9210-8
INSPEC Accession Number: 8946622
Digital Object Identifier : 10.1109/ICASIC.2005.1611299
Date of Current Version : 03 April 2006
Link: http://ieeexplore.ieee.org/search/f...nements=*&pageNumber=3&searchField=Search All


17. Electrical Characteristic Fluctuations in Sub-45nm CMOS Devices
Fu-Liang Yang Jiunn-Ren Hwang Yiming Li
Taiwan Semicond. Manuf. Co., Hsinchu City

This paper appears in: Custom Integrated Circuits Conference, 2006. CICC '06. IEEE
Issue Date : 10-13 Sept. 2006
On page(s): 691 - 694
Location: San Jose, CA
Print ISBN: 1-4244-0075-9
INSPEC Accession Number: 9464656
Digital Object Identifier : 10.1109/CICC.2006.320881
Date of Current Version : 26 February 2007
Link: http://ieeexplore.ieee.org/search/f...nements=*&pageNumber=3&searchField=Search All



18. High-performance high-κ/metal gates for 45nm CMOS and beyond with gate-first processing
Chudzik, M. Doris, B. Mo, R. Sleight, J. Cartier, E. Dewan, C. Park, D. Bu, H. Natzle, W. Yan, W. Ouyang, C. Henson, K. Boyd, D. Callegari, S. Carter, R. Casarotto, D. Gribelyuk, M. Hargrove, M. He, W. Kim, Y. Linder, B. Moumen, N. Paruchuri, V.K. Stathis, J. Steen, M. Vayshenker, A. Wang, X. Zafar, S. Ando, T. Iijima, R. Takayanagi, M. Narayanan, V. Wise, R. Zhang, Y. Divakaruni, R. Khare, M. Chen, T.C.
IBM Semicond. Res. & Dev. Center, Hopewell

This paper appears in: VLSI Technology, 2007 IEEE Symposium on
Issue Date : 12-14 June 2007
On page(s): 194 - 195
Location: Kyoto
Print ISBN: 978-4-900784-03-1
INSPEC Accession Number: 9816749
Digital Object Identifier : 10.1109/VLSIT.2007.4339689
Date of Current Version : 08 October 2007
Link: http://ieeexplore.ieee.org/search/f...nements=*&pageNumber=3&searchField=Search All


19. Characterization, modelling and simulation of Sub-45nm SOI devices
Rodriguez, N. Gamiz, F. Cristoloveanu, S.
Fac. de Ciencias, Dept. de Electron. y Tecnol. de Comput., Univ. de Granada, Granada, Spain

This paper appears in: Semiconductor Conference, 2009. CAS 2009. International
Issue Date : 12-14 Oct. 2009
Volume : 1
On page(s): 57 - 63
Location: Sinaia
ISSN : 1545-827X
Print ISBN: 978-1-4244-4413-7
INSPEC Accession Number: 10978917
Digital Object Identifier : 10.1109/SMICND.2009.5336609
Date of Current Version : 17 November 2009
Link: http://ieeexplore.ieee.org/search/f...ements=*&pageNumber=11&searchField=Search All
20. A 45 nm CMOS node Cu/Low-k/ Ultra Low-k PECVD SiCOH (k=2.4) BEOL Technology
Sankaran, S. Arai, S. Augur, R. Beck, M. Biery, G. Bolom, T. Bonilla, G. Bravo, O. Chanda, K. Chae, M. Chen, F. Clevenger, L. Cohen, S. Cowley, A. Davis, P. Demarest, J. Doyle, J. Dimitrakopoulos, C. Economikos, L. Edelstein, D. Farooq, M. Filippi, R. Fitzsimmons, J. Fuller, N. Gates, S. M. Greco, S. E. Grill, A. Grunow, S. Hannon, R. Ida, K. Jung, D. Kaltalioglu, E. Kelling, M. Ko, T. Kumar, K. Labelle, C. Landis, H. Lane, M.W. Landers, W. Lee, M. Li, W. Liniger, E. Liu, X. Lloyd, J. R. Liu, W. Lustig, N. Malone, K. Marokkey, S. Matusiewicz, G. McLaughlin, P. S. McLaughlin, P. V. Mehta, S. Melville, I. Miyata, K. Moon, B. Nitta, S. Nguyen, D. Nicholson, L. Nielsen, D. Ong, P. Patel, K. Patel, V. Park, W. Pellerin, J. Ponoth, S. Petrarca, K. Rath, D. Restaino, D. Rhee, S. Ryan, E.T. Shoba, H. Simon, A. Simonyi, E. Shaw, T.M. Spooner, T. Standaert, T. Sucharitaves, J. Tian, C. Wendt, H. Werking, J. Widodo, J. Wiggins, L. Wisnieff, R. Ivers, T.
IBM Syst. & Technol. Group, IBM Semicond. Res. & Dev. Center, Hopewell Junction, NY

This paper appears in: Electron Devices Meeting, 2006. IEDM '06. International
Issue Date : 11-13 Dec. 2006
On page(s): 1 - 4
Location: San Francisco, CA
Print ISBN: 1-4244-0439-8
INSPEC Accession Number: 9465699
Digital Object Identifier : 10.1109/IEDM.2006.346782
Date of Current Version : 16 April 2007
Link: http://ieeexplore.ieee.org/search/f...ements=*&pageNumber=21&searchField=Search All

Anh admin ởi,

Sao ẩn bài của em lâu thế? Có vi phạm gì không? Em đang cần mấy bài báo về công nghệ 45nm này để làm bài report gấp. Mong anh giúp cho.

Cảm ơn và thân chào anh.