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1- A Theoretical Basis for the Analysis of Multiversion Software Subject to Coincident Errors
Eckhardt, D.E., Jr. Lee, L.D.
This paper appears in: Software Engineering, IEEE Transactions on
Publication Date: Dec. 1985
Volume: SE-11, Issue: 12
On page(s): 1511- 1517
ISSN: 0098-5589
Current Version Published: 2006-09-18
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1701974
2- Evaluation and comparison of fault-tolerant software techniques
Hudak, J.J. Suh, B.-H. Siewiorek, D.P. Segall, Z.
Carnegie Mellon Univ., Pittsburgh, PA;
This paper appears in: Reliability, IEEE Transactions on
Publication Date: Jun 1993
Volume: 42, Issue: 2
On page(s): 190-204
ISSN: 0018-9529
References Cited: 21
CODEN: IERQAD
INSPEC Accession Number: 4505228
Digital Object Identifier: 10.1109/24.229487
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=229487
3- Architectural principles for safety-critical real-time applications
Lala, J.H. Harper, R.E.
Charles Stark Draper Lab. Inc., Cambridge, MA;
This paper appears in: Proceedings of the IEEE
Publication Date: Jan 1994
Volume: 82, Issue: 1
On page(s): 25-40
ISSN: 0018-9219
References Cited: 32
CODEN: IEEPAD
INSPEC Accession Number: 4646680
Digital Object Identifier: 10.1109/5.259424
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=259424
4- Fault Equivalence in Combinational Logic Networks
McCluskey, E.J. Clegg, F.W.
This paper appears in: Computers, IEEE Transactions on
Publication Date: Nov. 1971
Volume: C-20, Issue: 11
On page(s): 1286- 1293
ISSN: 0018-9340
Current Version Published: 2006-08-14
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1671722
5- Probability models for pseudorandom test sequences
McCluskey, E.J. Makar, S. Mourad, S. Wagner, K.D.
Center for Reliable Comput., Stanford Univ., CA ;
This paper appears in: Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
Publication Date: Jan 1988
Volume: 7, Issue: 1
On page(s): 68-74
ISSN: 0278-0070
References Cited: 26
CODEN: ITCSDI
INSPEC Accession Number: 3130638
Digital Object Identifier: 10.1109/43.3131
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=3131
6- Common-mode failures in redundant VLSI systems: a survey
Mitra, S. Saxena, N.R. McCluskey, E.J.
Center for Reliable Comput., Stanford Univ., CA ;
This paper appears in: Reliability, IEEE Transactions on
Publication Date: Sep 2000
Volume: 49, Issue: 3
On page(s): 285-295
ISSN: 0018-9529
References Cited: 57
CODEN: IERQAD
INSPEC Accession Number: 6896665
Digital Object Identifier: 10.1109/24.914545
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=914545
7- Fault escapes in duplex systems
Mitra, S. Saxena, N.R. McCluskey, E.J.
Dept. of Electr. Eng., Stanford Univ., CA;
This paper appears in: VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Publication Date: 2000
On page(s): 453-458
Meeting Date: 04/30/2000 - 05/04/2000
Location: Montreal, Que., Canada
ISBN: 0-7695-0613-5
References Cited: 18
INSPEC Accession Number: 6656774
Digital Object Identifier: 10.1109/VTEST.2000.843878
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=843878
8- Design diversity for concurrent error detection in sequential logiccircuits
Mitra, S. McCluskey, E.J.
Center for Reliable Comput., Stanford Univ., CA ;
This paper appears in: VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Publication Date: 2001
On page(s): 178-183
Meeting Date: 04/29/2001 - 05/03/2001
Location: Marina Del Rey, CA, USA
ISBN: 0-7695-1122-8
References Cited: 19
INSPEC Accession Number: 7023719
Digital Object Identifier: 10.1109/VTS.2001.923436
Current Version Published: 2002-08-07
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=923436
9- Design of redundant systems protected against common-mode failures
Mitra, S. McCluskey, E.J.
Center for Reliable Comput., Stanford Univ., CA ;
This paper appears in: VLSI Test Symposium, 19th IEEE Proceedings on. VTS 2001
Publication Date: 2001
On page(s): 190-195
Meeting Date: 04/29/2001 - 05/03/2001
Location: Marina Del Rey, CA, USA
ISBN: 0-7695-1122-8
References Cited: 14
INSPEC Accession Number: 7023721
Digital Object Identifier: 10.1109/VTS.2001.923438
Current Version Published: 2002-08-07
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=923438
10- Heavy ion and proton-induced single event multiple upset
Reed, R.A. Carts, M.A. Marshall, P.W. Marshall, C.J. Musseau, O. McNulty, P.J. Roth, D.R. Buchner, S. Melinger, J. Corbiere, T.
Naval Res. Lab., Washington, DC;
This paper appears in: Nuclear Science, IEEE Transactions on
Publication Date: Dec 1997
Volume: 44, Issue: 6, Part 1
On page(s): 2224-2229
Meeting Date: 07/21/1997 - 07/25/1997
Location: Snowmass Village, CO, USA
ISSN: 0018-9499
References Cited: 28
CODEN: IETNAE
INSPEC Accession Number: 5804603
Digital Object Identifier: 10.1109/23.659039
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=659039
11- Dependable adaptive computing systems-the ROAR project
Saxena, N.R. McCluskey, E.J.
Center for Reliable Comput., Stanford Univ., CA ;
This paper appears in: Systems, Man, and Cybernetics, 1998. 1998 IEEE International Conference on
Publication Date: 11-14 Oct 1998
Volume: 3, On page(s): 2172-2177 vol.3
Meeting Date: 10/11/1998 - 10/14/1998
Location: San Diego, CA, USA
ISBN: 0-7803-4778-1
References Cited: 12
INSPEC Accession Number: 6189461
Digital Object Identifier: 10.1109/ICSMC.1998.724977
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=724977
12- Reliability Modeling of Compensating Module Failures in Majority Voted Redundancy
Siewiorek, D.P.
This paper appears in: Computers, IEEE Transactions on
Publication Date: May 1975
Volume: C-24, Issue: 5
On page(s): 525- 533
ISSN: 0018-9340
Current Version Published: 2006-08-14
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1672849
13- Reliability of majority voting based VLSI fault-tolerant circuits
Stroud, C.E.
Dept. of Electr. Eng., Kentucky Univ., Lexington, KY;
This paper appears in: Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
Publication Date: Dec 1994
Volume: 2, Issue: 4
On page(s): 516-521
ISSN: 1063-8210
References Cited: 13
CODEN: IEVSE9
INSPEC Accession Number: 4839257
Digital Object Identifier: 10.1109/92.335020
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=335020
14- Fault Folding for Irredundant and Redundant Combinational Circuits
Kilin To
This paper appears in: Computers, IEEE Transactions on
Publication Date: Nov. 1973
Volume: C-22, Issue: 11
On page(s): 1008- 1015
ISSN: 0018-9340
Current Version Published: 2006-08-14
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1672230
15- Failure-Tolerant Sequential Machines with Past Information
Tohma, Y. Aoyagi, S.
This paper appears in: Computers, IEEE Transactions on
Publication Date: April 1971
Volume: C-20, Issue: 4
On page(s): 392- 396
ISSN: 0018-9340
Current Version Published: 2006-08-14
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=1671847
16- Modeling correlation in software recovery blocks
Tomek, L.A. Muppala, J.K. Trivedi, K.S.
Dept. of Comput. Sci., Duke Univ., Durham, NC;
This paper appears in: Software Engineering, IEEE Transactions on
Publication Date: Nov 1993
Volume: 19, Issue: 11
On page(s): 1071-1086
ISSN: 0098-5589
References Cited: 27
CODEN: IESEDJ
INSPEC Accession Number: 4609806
Digital Object Identifier: 10.1109/32.256854
Current Version Published: 2002-08-06
Link: http://ieeexplore.ieee.org/xpl/freeabs_all.jsp?arnumber=256854

Khoá topic với lý do: NTi dung trùng lặp